Huang Peizhen
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Education Level:西安交通大学
Alma Mater:西安交通大学
Scientific Research
Current position:
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Scientific Research
Research Field
Paper Publications
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Phase field simulation of the void destabilization and splitting processes in interconnects under electromigration induced surface diffusion.Modelling and Simulation Materials Science and Engineering.2022,Vol. 30(1)
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Phase field simulation of healing and growth of voids in interconnects under electric field induced interface migration.European Journal of Mechanics - A.2022,Vol. 94
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Phase field simulation of the instability and splitting processes of elliptical inclusions in interconnects due to anisotropic interface diffusion under electric and stress fields.AIP Advances.2022,Vol. 12(6)
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Phase-field simulation of inclusion evolution in {110}-oriented single crystal metal interconnects under electromigration induced anisotropic interface diffusion.Applied Physicas A.2022,128
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Phase field simulation of intragranular microvoids evolution due to surface diffusion in stress field.Transactions of Nanjing University of Aeronautics and Astronautics.2022,Vol. 39(3)