Journal:AIP Advances
Document Type:J
Volume:Vol. 12
Issue:6
Translation or Not:no
Date of Publication:2022-03-20
Included Journals:SCIE
Date of Publication:2022-03-20
Huang Peizhen
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Education Level:西安交通大学
Alma Mater:西安交通大学
Paper Publications
Phase field simulation of the instability and splitting processes of elliptical inclusions in interconnects due to anisotropic interface diffusion under electric and stress fields
Date of Publication:2022-03-20 Hits: