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Degree:Doctoral Degree in Engineering
School/Department:College of Aerospace Engineering

Huang Peizhen

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Education Level:西安交通大学

Alma Mater:西安交通大学

Paper Publications

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Phase-field simulation of inclusion evolution in {110}-oriented single crystal metal interconnects under electromigration induced anisotropic interface diffusion
Date of Publication:2022-05-05 Hits:

Journal:Applied Physicas A
Document Type:J
Volume:128
Translation or Not:no
Date of Publication:2022-05-05
Included Journals:SCIE
Date of Publication:2022-05-05

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