Personal Homepage

Personal Information

MORE+

Degree:Doctoral Degree in Engineering
School/Department:College of Aerospace Engineering

Huang Peizhen

+

Education Level:西安交通大学

Alma Mater:西安交通大学

Paper Publications

Current position: Home / Scientific Research / Paper Publications
Phase field simulation of the void destabilization and splitting processes in interconnects under electromigration induced surface diffusion
Date of Publication:2022-01-08 Hits:

Journal:Modelling and Simulation Materials Science and Engineering
Document Type:J
Volume:Vol. 30
Issue:1
Translation or Not:no
Date of Publication:2022-01-08
Included Journals:SCIE
Date of Publication:2022-01-08

Next One:Phase field simulation of healing and growth of voids in interconnects under electric field induced interface migration

  • Click:
  • MOBILE Version

The Last Update Time:..

Copyright©2018- Nanjing University of Aeronautics and Astronautics·Informationization Department(Informationization Technology Center)