Chen Xin
Associate Professor
Supervisor of Master's Candidates
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Paper Publications
[1].Triple-node-upset self-recoverable latch design for aerospace applications:Microelectronics Reliability,2024
[2].Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Ap...:IEEE Transactions on Circuits and Systems--I: Regular Papers,2024
[3].Double-Node-Upset Self-Recoverable Latch Design for Wide Voltage Range Application:IEEE Transactions on Circuits and Systems II: Express Briefs,2023
[4].Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS:IEEE Transactions on Very Large Scale Integration (VLSI) Systems,2023
[5].FPGA Design of Blind Zone-Suppressed Phase Frequency Detector via Reset Mask and Edge Recovery Op...:Circuits, Systems, and Signal Processing,2023
[6]Bai Y,,Chen X.A Novel Latch Circuit Against Single Event Upset:AIEA，IEEE CS CPS,2020:500-503
[7].Implementation of Highly Reliable Convolutional Neural Network with Low Overhead on Field-Program...:Electronics,2024
[8].SEU/SET Evaluation of Digital VLSI Design from Register Transfer Level to Layout Level:2023 7th International Conference on Electrical, Mechanical and Computer Engineering (ICEMCE),2023
[9].Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection:Journal of Electronic Testing,2023
[10].FPGA-Based Cross-Hardware MBU Emulation Platform for Layout-Level Digital VLSI:2023 IEEE 32nd Asian Test Symposium (ATS),2023
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