Affiliation of Author(s):自动化学院
Journal:European Conf. Power Electron. Appl., EPE ECCE Europe
Abstract:In order to solve the reliability problem of Solid State Power Controller (SSPC), focusing on its internal weak point, the paper carries out reliability prediction of SiC MOSFET based on Physics of Failure (PoF) model under actual mission profile of SSPC, which seems to be more accurate and reliable. © 2018 EPE Association.
Translation or Not:no
Date of Publication:2018-10-30
Co-author:Chen, Qingwen,Shanshui Yang
Correspondence Author:王莉,Wang Li