陈鑫
开通时间:..
最后更新时间:..
点击次数:
发表刊物:IEEE Transactions on Circuits and Systems II: Express Briefs
论文类型:期刊论文
是否译文:否
发表时间:2023-10-12
收录刊物:EI、SCI
上一条:Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Application
下一条:Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS