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所属单位：自动化学院
发表刊物：European Conf. Power Electron. Appl., EPE ECCE Europe
摘要：In order to solve the reliability problem of Solid State Power Controller (SSPC), focusing on its internal weak point, the paper carries out reliability prediction of SiC MOSFET based on Physics of Failure (PoF) model under actual mission profile of SSPC, which seems to be more accurate and reliable. © 2018 EPE Association.
是否译文：否
发表时间：2018-10-30
合写作者：Chen, Qingwen,杨善水
通讯作者：王莉,王莉