Pi Dechang
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Software Reliability Growth Model for Imperfect Debugging Process Considering Testing-Effort and Testing Coverage
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Affiliation of Author(s):计算机科学与技术学院/人工智能学院/软件学院

Journal:Trans. Nanjing Univ. Aero. Astro.

Abstract:Because of the inevitable debugging lag, imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model. Considering neither testing-effort nor testing coverage can describe software reliability for imperfect debugging completely, by hybridizing testing-effort with testing coverage under imperfect debugging, this paper proposes a new model named GMW-LO-ID. Under the assumption that the number of faults is proportional to the current number of detected faults, this model combines generalized modified Weibull (GMW) testing-effort function with logistic (LO) testing coverage function, and inherits GMW's amazing flexibility and LO's high fitting precision. Furthermore, the fitting accuracy and predictive power are verified by two series of experiments and we can draw a conclusion that our model fits the actual failure data better and predicts the software future behavior better than other ten traditional models, which only consider one or two points of testing-effort, testing coverage and imperfect debugging. © 2018, Editorial Department of Transactions of NUAA. All right reserved.

ISSN No.:1005-1120

Translation or Not:no

Date of Publication:2018-06-01

Co-author:臧思聪

Correspondence Author:Pi Dechang

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Professor
Supervisor of Doctorate Candidates

Alma Mater:南京航空航天大学

School/Department:College of Computer Science and Technology

Business Address:南航江宁校区东区计算机学院

Contact Information:邮箱:nuaacs@126.com 电话:025-52110071

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