Affiliation of Author(s):自动化学院
Journal:J. Power Electron.
Abstract:Condition monitoring has been recognized as an effective and low-cost method to enhance the reliability and improve the maintainability of power electronic converters. In power electronic converters, high-frequency oscillation occurs during the switching transients of power transistors, which is known as ringing. The ringing frequency mainly depends on the values of the parasitic capacitance and stray inductance in the oscillation loop. Although circuit stray inductance is an important factor that leads to the ringing, it does not change with transistor aging. A shift in either the inside inductance or junction capacitance is an important failure precursor for power transistors. Therefore, ringing frequency can be used to monitor the health of power transistors. However, the switching actions of power transistors usually result in a dynamic behavior that can generate oscillation signals mixed with background noise, which makes it hard to directly extract the ringing frequency. A frequency extraction method based on empirical mode decomposition (EMD) and Fast Fourier transformation (FFT) is proposed in this paper. The proposed method is simple and has a high precision. Simulation results are given to verify the ringing analysis and experimental results are given to verify the effectiveness of the proposed method. © 2019 KIPE.
ISSN No.:1598-2092
Translation or Not:no
Date of Publication:2019-01-01
Co-author:Ren, Lei
Correspondence Author:gcy
Date of Publication:2019-01-01