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所属单位：机电学院

发表刊物：J. Mod. Opt.

摘要：Nonlinearities in the application of fringe projection metrology make it very difficult to acquire perfect 3D data. This paper describes a six-step phase-shifting technique for a structured light measurement system with an off-the-shelf projector. First, the phase error is analysed and a gamma model is established by deriving the relative expression between the wrapped phase and input images. This is then expressed in matrix form to derive a unique solution, which is used for the gamma solver. The complex gamma calibration and projector error compensation can be removed once the gamma value of the off-the-shelf projector has been determined. The ideal model reconstruction results are obtained through simulations and experiments, and the standard deviation of the phase error is found to be only 0.0039 radians. Hence, the proposed method eliminates the nonlinear errors associated with fringe projection technology using existing projectors and improves the overall image reconstruction quality. © 2019, © 2019 Informa UK Limited, trading as Taylor & Francis Group.

ISSN号：0950-0340

是否译文：否

发表时间：2019-01-01

合写作者：Jiang, Tao,程筱胜,田威,廖文和

通讯作者：崔海华