Journal:IEEE Transactions on Reliability
Indexed by:Journal paper
Document Type:J
Volume:65
Issue:4
Page Number:1755 - 1768
ISSN No.:1558-1721
Translation or Not:no
Date of Publication:2016-10-06
Included Journals:SSCI、SCIE
Associate Professor
Supervisor of Master's Candidates
Gender:Male
Alma Mater:北京航空航天大学
Education Level:With Certificate of Graduation for Doctorate Study
Degree:Doctoral Degree in Engineering
School/Department:电子信息工程学院
Discipline:Electrical Circuit and System. Microelectronics and Solid-state Electronics
Business Address:将军路校区工程训练中心8312
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