A Machine Learning Attack-Resilient Strong PUF Leveraging the Process Variation of MRAM
- Journal:IEEE Trans. on Circuits and Systems II: Express Briefs
 - Indexed by:Journal paper
 - Discipline:Engineering
 - First-Level Discipline:Electronic Science and Techonology
 - Document Type:J
 - Volume:69
 - Issue:6
 - Translation or Not:no
 - Included Journals:SCIE
 - Date of Publication:2022-01-28
 

