A Machine Learning Attack-Resilient Strong PUF Leveraging the Process Variation of MRAM
- Journal:IEEE Trans. on Circuits and Systems II: Express Briefs
- Indexed by:Journal paper
- Discipline:Engineering
- First-Level Discipline:Electronic Science and Techonology
- Document Type:J
- Volume:69
- Issue:6
- Translation or Not:no
- Included Journals:SCIE
- Date of Publication:2022-01-28