![]() |
个人信息Personal Information
教授 博士生导师
招生学科专业:
机械工程 -- 【招收博士、硕士研究生】 -- 机电学院
航空宇航科学与技术 -- 【招收硕士研究生】 -- 机电学院
机械 -- 【招收博士、硕士研究生】 -- 机电学院
性别:男
毕业院校:中国科学院理化技术研究所
学历:博士研究生毕业
学位:理学博士学位
所在单位:机电学院
办公地点:机电学院15-353。
电子邮箱:
Effect of chemical additive on fixed abrasive pad self-conditioning in CMP
点击次数:
所属单位:机电学院
发表刊物:INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
关键字:Fixed abrasive polishing Wear ratio Fixed abrasive pad Self-conditioning Chemical additive
摘要:Self-conditioning performance of polishing pad is an important characteristic to influence processing efficiency and service life in chemical mechanical polishing (CMP). The slurry can react with the pad surface, which affects its self-conditioning performance in fixed abrasive polishing process. Wear ratio of wafer material removal rate (MRR) and pad wear rate is introduced to evaluate self-conditioning performance of fixed abrasive pad (FAP). To clear the effect of chemical additive on FAP self-conditioning, wear ratio, FAP surface topography, friction coefficient, and acoustic emission signal of polishing process were investigated in fixed abrasive polishing of quartz glass with ferric nitrate, ethylenediamine (EDA), and triethanolamine (TEA) slurry, respectively. Results indicate that TEA slurry can provide excellent self-conditioning of FAP in fixed abrasive polishing of quartz glass. MRR and wear ratio maintain high levels during the whole polishing process. Friction coefficient and acoustic emission signal are more stable than that of the other two chemical additives. An appropriate amount of TEA, which is beneficial to enhance MRR and extends service life of FAP, is added in the polishing slurry to improve FAP self-conditioning in fixed abrasive polishing process.
ISSN号:0268-3768
是否译文:否
发表时间:2017-01-01
合写作者:Huang, Jiandong,Xia, Lei,朱永伟,左敦稳
通讯作者:李军