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所属单位：航空宇航学院

发表刊物：Small

摘要：The relationship between layer numbers and colors of the mechanical-exfoliated black phosphorus (BP) samples on 300 nm SiO2/Si wafers through the reflection spectrum calculations combining with the International Commission on Illumination (CIE 1931) color space. The sRGB parameters changing with layer numbers are calculated and the colorbar is drawn when the incident light is white light from halogen lamp in optical microscope. The calculation results are consistent with the experiments and provide effective information for rapid identification of the layer number range of BP. The contrasts of few-layer BP are also presented, according to which the optimal selection of substrates and wavelength are proposed. On the basis of the colorbar, one can conveniently and efficiently identify approximate layer number range of BP layers by simply comparing colors. Adjusting different substrates or monochromatic light can further enhance the visibility of BP.

卷号：13

期号：5

ISSN号：1613-6810

是否译文：否

发表时间：2017-01-01

收录刊物：EI

通讯作者：Chen, Hongye