Affiliation of Author(s):电子信息工程学院
Journal:APPLIED COMPUTATIONAL ELECTROMAGNETICS SOCIETY JOURNAL
Key Words:AM-DGTD method reflection coefficient statistical analysis uncertainty quantification
Abstract:An imperfect coating shall cause uncertainties in the analysis of electromagnetic properties. To quantify the influence of irregularity, complexity, and uncertainty of the coatings for electronic devices, an adaptive mesh algorithm combined with the discontinuous Galerkin time domain (AM-DGTD) method is developed. The uncertain variations are incorporated into the proposed algorithm by an appropriate parameterization. The standard statistical analysis is performed to calculate the appropriate moments, i.e., mean and variance. The developed method is validated by modeling a dielectric coating with uncertain flaws in an adaptive mesh grid. The computed quantities of interest from numerical estimations are compared with the analytical values, these results agree with the physical explanation, and are in good agreement with the exact values, as demonstrated by numerical experiments.
ISSN No.:1054-4887
Translation or Not:no
Date of Publication:2018-05-01
Co-author:Li, Huiping,Hussain, Ishfaq,cqs
Correspondence Author:cqs,WANG Yi
Associate Professor
Supervisor of Master's Candidates
Gender:Male
Alma Mater:Nanjing University of Aeronautics and Astronautics
Education Level:With Certificate of Graduation for Doctorate Study
Degree:Doctoral Degree in Engineering
School/Department:College of Electronic and Information Engineering
Discipline:Electromagnetic Fields and Microwave Technology
Business Address:CEIE, NUAA, Nanjing, China
Contact Information:jflsjfls@nuaa.edu.cn
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