教授 博士生导师
性别:女
毕业院校:中国科学技术大学
学历:硕士研究生毕业
学位:工学硕士学位
所在单位:电子信息工程学院
办公地点:电子信息工程学院楼 438室
联系方式:025-84892403
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所属单位:电子信息工程学院
发表刊物:ELECTRONICS
关键字:differential power analysis (DPA) SIMON fault injection double rate power randomization
摘要:Differential power analysis (DPA) is an effective side channel attack method, which poses a critical threat to cryptographic algorithms, especially lightweight ciphers such as SIMON. In this paper, we propose an area-efficient countermeasure against DPA on SIMON based on the power randomization. Firstly, we review and analyze the architecture of SIMON algorithm. Secondly, we prove the threat of DPA attack to SIMON by launching actual DPA attack on SIMON 32/64 circuit. Thirdly, a low-cost power randomization scheme is proposed by combining fault injection with double rate technology, and the corresponding circuit design is implemented. To the best of our knowledge, this is the first scheme that applies the combination of fault injection and double rate technology to the DPA-resistance. Finally, the t-test is used to evaluate the security mechanism of the proposed designs with leakage quantification. Our experimental results show that the proposed design implements DPA-resistance of SIMON algorithm at certain overhead the cost of 47.7% LUTs utilization and 39.6% registers consumption. As compared to threshold implementation and bool mask, the proposed scheme has greater advantages in resource consumption.
ISSN号:2079-9292
是否译文:否
发表时间:2019-02-01
合写作者:Zhang, Yuanyuan,周芳,Zhang, Jinbao,Yahya, Muhammad Rehan
通讯作者:吴宁