Affiliation of Author(s):电子信息工程学院
Journal:RADIO SCIENCE
Key Words:VNA UNCERTAINTIES
Abstract:In this paper, a detailed analysis of n-port vector network analyzer measurement uncertainties due to nonideal standards for multiport through-reflect-line calibration is presented. By using the concept of general node equations, the error correction equation is simplified by the matrix operation; thus, a generalized formula for the deviations of the measured S parameters with respect to the error terms is derived, which can be implemented in further analysis of multiport measurement uncertainties applying arbitrary calibration method based on 4n-term error model. The final expressions for the sensitivity coefficients of S parameters with simple and clear form provide a deeper understanding of error propagation mechanisms.
ISSN No.:0048-6604
Translation or Not:no
Date of Publication:2017-09-01
Co-author:zyj,Jin, Y. M.,zyg
Correspondence Author:wms
Date of Publication:2017-09-01
汪明生
+
Education Level:南京航空航天大学
Paper Publications
Sensitivity analysis of multiport S-parameter measurements due to nonideal TRL calibration standards
Date of Publication:2017-09-01 Hits: