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所属单位：航空学院

发表刊物：NDT E Int

摘要：A novel method used for quantitative detection of internal defects with boundary of arbitrary shape is proposed in this paper for the first time. This method can be used to determine accurately the location and size of internal defects based on sequential morphological opening, filling and binarizing operations on the wrapped phase of out-of-plane deformation in phase-shifting digital speckle pattern interferometry. Because internal defects are detected directly from a wrapped phase rather than an unwrapped phase, the method proposed in this paper requires neither unwrapping of wrapped phase nor denoising of interference fringes when used for quantitative detection of internal defects. Theoretical analysis, numerical simulation, experimental verification and error calculation are presented in this paper. © 2019 Elsevier Ltd

ISSN号：0963-8695

是否译文：否

发表时间：2019-04-01

通讯作者：王开福