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  • 皮德常 ( 教授 )

    的个人主页 http://faculty.nuaa.edu.cn/pdc/zh_CN/index.htm

  •   教授   博士生导师
  • 招生学科专业:
    计算机科学与技术 -- 【招收博士、硕士研究生】 -- 计算机科学与技术学院
    软件工程 -- 【招收博士、硕士研究生】 -- 计算机科学与技术学院
    网络空间安全 -- 【招收硕士研究生】 -- 计算机科学与技术学院
    电子信息 -- 【招收博士、硕士研究生】 -- 计算机科学与技术学院
论文成果 当前位置: 中文主页 >> 科学研究 >> 论文成果
Software Reliability Growth Model for Imperfect Debugging Process Considering Testing-Effort and Testing Coverage

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所属单位:计算机科学与技术学院/人工智能学院/软件学院
发表刊物:Trans. Nanjing Univ. Aero. Astro.
摘要:Because of the inevitable debugging lag, imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model. Considering neither testing-effort nor testing coverage can describe software reliability for imperfect debugging completely, by hybridizing testing-effort with testing coverage under imperfect debugging, this paper proposes a new model named GMW-LO-ID. Under the assumption that the number of faults is proportional to the current number of detected faults, this model combines generalized modified Weibull (GMW) testing-effort function with logistic (LO) testing coverage function, and inherits GMW's amazing flexibility and LO's high fitting precision. Furthermore, the fitting accuracy and predictive power are verified by two series of experiments and we can draw a conclusion that our model fits the actual failure data better and predicts the software future behavior better than other ten traditional models, which only consider one or two points of testing-effort, testing coverage and imperfect debugging. © 2018, Editorial Department of Transactions of NUAA. All right reserved.
ISSN号:1005-1120
是否译文:否
发表时间:2018-06-01
合写作者:臧思聪
通讯作者:皮德常

 

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