黄佩珍
  • 招生学科专业:
    力学 -- 【招收博士、硕士研究生】 -- 航空学院
    机械 -- 【招收硕士研究生】 -- 航空学院
  • 学位:工学博士学位
  • 职称:教授
  • 所在单位:航空学院
教师英文名称:Huang Peizhen
电子邮箱:
所在单位:航空学院
学历:西安交通大学
联系方式:15365006690
毕业院校:西安交通大学

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标题:
The evolution of intragranular voids under interface migration induced by stress migration
点击次数:
所属单位:
航空学院
发表刊物:
Lixue Xuebao
摘要:
With the rapid development of microelectronics technology, the failure of interconnects in the integrated circuit raises wide attention. The interconnects inevitably exist some drawbacks, such as voids and cracks. If the drawbacks nucleate, grow and change their shape to form crack-like slits oriented perpendicular to an interconnect line, an open circuit could result. This is a common form of interconnects failure. And interface migration is one of the main mechanisms leading to the evolution of microstructure. Based on the classic theory and weak statement of interface migration, a finiteelement method is developed to simulate the evolution of intragranular voids in copper interconnects caused by interface migration induced by stress migration. The validity of the method is confirmed by the agreement of the numerically simulated the undulating surface with that predicted theoretically. Through a large number of numerical simulations, we find that the evolution of the intragranular voids has two trends, namely, void growth and void shrinkage. And the shape of the void is governed by the stress, σ, the linewidth, h, and the initial aspect ratio of the intragranular void, β, and there exist critical values for these parameters (σc, hc andβc ). Whenσ≥σc, h≤hc orβ≥βc, the intragranular void will grow along the major axis; otherwise, the intragranular void will shrink into a cylinder. The increase of the stress, or the aspect ratio, or the decrease of the linewidth is beneficial to void growth. And the area of void growth will increase faster with bigger σ, smaller h or biggerβ. But, the decrease of the stress or the aspect ratio, or increase the linewidth accelerates void shrinkage and the shrinkage area will decrease faster with smaller σ, bigger h or smallerβ. © 2018, Editorial Office of Chinese Journal of Theoretical and Applied Mechanics. All right reserved.
ISSN号:
0459-1879
是否译文:
发表时间:
2018-07-18
发表时间:
2018-07-18
个人简介

黄佩珍,女,工学博士,现任南京航空航天大学航空学院教授/博士生导师。主要从事工程问题的力学建模和仿真、材料力学行为的表征和建模、细观力学和材料微结构演变动力学等方面的研究工作。主持完成多项国家自然科学基金、省部级基金和校级基金项目。国内外相关刊物上发表学术期刊论文近60篇,其中SCIEI收录论文30余篇,被SCI他引40余次。已授权国家发明专利8项。参编由van der Zwaag主编Springer Publishers出版的专著《Self Healing Materials》。博士学位论文被评为西安交通大学和陕西省优秀博士论文,并获2003年度全国优秀博士论文提名。

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