中文

Vision system for surface roughness and surface defect measurement

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  • Affiliation of Author(s):自动化学院

  • Journal:Opt Eng

  • Abstract:A vision system for surface roughness and surface defect measurement is introduced. This system applies two cameras for capturing the laser pattern and scattering images simultaneously. Three features are extracted from the scattering images to characterize the surface roughness. The light pattern images are processed to locate the defect and compute the size of the defect. Some experiments have been performed, and the experimental results verify the feasibility of the method. © 2019 Society of Photo-Optical Instrumentation Engineers (SPIE).

  • ISSN No.:0091-3286

  • Translation or Not:no

  • Date of Publication:2019-06-01

  • Co-author:Bian, Dongliang

  • Correspondence Author:grp

  • Date of Publication:2019-06-01

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