Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique
- Journal:Sensors
- Indexed by:Journal paper
- Document Type:J
- Volume:12
- Issue:20
- Page Number:3390
- Translation or Not:no
- Included Journals:SSCI
Ge JiuhaoAssociate Professor
Jiuhao Ge is an associate professor in the Department of Measurement and Testing, College of Automation Engineering, Nanjing University of Aeronautics and Astronautics (NUAA). He is currently serving as a JSPS Postdoctoral Fellow (Japan Society for the Promotion of Science), an Associate Editor of Measurement, and a member of the Electromagnetic Nondestructive Testing Committee of the Chinese S...Detials